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Investigation of H⁺ implanted silicon wafers with two-beam cross-modulation photocarrier radiometryTOLEV, J; MANDELIS, A.The European physical journal. Special topics. 2008, Vol 153, pp 295-297, 3 p.Conference Paper

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Isotope effect of diffusion and electromigration of hydrogen in nickelPIETRZAK, R.Journal of materials science letters. 1996, Vol 15, Num 8, pp 731-733, issn 0261-8028Article

STM analysis of wet-chemically prepared H-Si(001) surfaceMORITA, Y; TOKUMOTO, H.Applied surface science. 1996, Vol 100-01, pp 440-443, issn 0169-4332Conference Paper

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